A PROBE HEAD HAVING HIGH FREQUENCY PERFORMANCES

A probe head (100) for the testing of electronic devices is herein described, the probe head having at least one contact probe (10) which comprises a body (10') which extends between a first end (10a) and a second end (10b), said ends (10a, 10b) being adapted to contact respective contact pads...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	VALLAURI, Raffaele, STUCCHI, Giulia, FELICI, Stefano, CRIPPA, Giuseppe, PADERNO, Nadia, CRIPPA, Roberto, CAMARRI, Camilla, MORGANA, Fabio
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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