ELECTRODE INSPECTION SYSTEM AND METHOD

An electrode inspection system is disclosed. The electrode inspection system according to an embodiment of the present disclosure can inspect the quality of an electrode during the moving of an electrode, and perform another process depending on the quality of the electrode. L'invention concern...

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Bibliographische Detailangaben
Hauptverfasser:	BAE, Joon Ho, LEE, Seong Heon, KIM, Song Hyeon, GIM, Jong Min, KANG, Hyun Min, JEON, Jae Geun, PARK, Sang Jun
Format:	Patent
Sprache:	eng ; fre ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY TESTING
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Beschreibung
Zusammenfassung:	An electrode inspection system is disclosed. The electrode inspection system according to an embodiment of the present disclosure can inspect the quality of an electrode during the moving of an electrode, and perform another process depending on the quality of the electrode. L'invention concerne un système d'inspection d'électrode. Le système d'inspection d'électrode selon un mode de réalisation de la présente invention peut inspecter la qualité d'une électrode pendant le déplacement d'une électrode, et effectuer un autre processus en fonction de la qualité de l'électrode. 전극 검사 시스템이 개시된다. 본 개시의 일 실시예에 따른 전극 검사 시스템은, 전극을 이동시키는 과정에서 전극의 품질을 검사하고 전극의 품질에 따라 다른 프로세스를 수행할 수 있다.