DETERIORATION TESTING DEVICE AND DETERIORATION TESTING METHOD
The present invention comprises: a light source (16) that irradiates a polymer-material specimen (21) with light; a bending mechanism (19) that switches between extending and bending the specimen (21); an imaging unit (22) that captures an image of the specimen (21); and an assessment unit (32) that...
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creator | MIWA Takashi FUJIMOTO Norihiro SUGIYAMA Akira TORIMOTO Manami NEGISHI Kaori |
description | The present invention comprises: a light source (16) that irradiates a polymer-material specimen (21) with light; a bending mechanism (19) that switches between extending and bending the specimen (21); an imaging unit (22) that captures an image of the specimen (21); and an assessment unit (32) that, on the basis of the image captured by the imaging unit (22), assesses whether the specimen (21) has deteriorated.
La présente invention comprend : une source de lumière (16) qui émet un échantillon de matériau polymère (21) avec de la lumière ; un mécanisme de flexion (19) qui commute entre l'extension et la flexion de l'échantillon (21) ; une unité d'imagerie (22) qui capture une image de l'échantillon (21) ; et une unité d'évaluation (32) qui, sur la base de l'image capturée par l'unité d'imagerie (22), évalue si l'échantillon (21) s'est détérioré.
高分子材料の試験体(21)に光を照射する光源(16)と、試験体(21)の伸長、屈曲を切り替える屈曲機構(19)と、試験体(21)を撮像する撮像部(22)と、撮像部(22)で撮像された画像に基づいて、試験体(21)の劣化を判定する判定部(32)と、を備える。 |
format | Patent |
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La présente invention comprend : une source de lumière (16) qui émet un échantillon de matériau polymère (21) avec de la lumière ; un mécanisme de flexion (19) qui commute entre l'extension et la flexion de l'échantillon (21) ; une unité d'imagerie (22) qui capture une image de l'échantillon (21) ; et une unité d'évaluation (32) qui, sur la base de l'image capturée par l'unité d'imagerie (22), évalue si l'échantillon (21) s'est détérioré.
高分子材料の試験体(21)に光を照射する光源(16)と、試験体(21)の伸長、屈曲を切り替える屈曲機構(19)と、試験体(21)を撮像する撮像部(22)と、撮像部(22)で撮像された画像に基づいて、試験体(21)の劣化を判定する判定部(32)と、を備える。</description><language>eng ; fre ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240606&DB=EPODOC&CC=WO&NR=2024116343A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240606&DB=EPODOC&CC=WO&NR=2024116343A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MIWA Takashi</creatorcontrib><creatorcontrib>FUJIMOTO Norihiro</creatorcontrib><creatorcontrib>SUGIYAMA Akira</creatorcontrib><creatorcontrib>TORIMOTO Manami</creatorcontrib><creatorcontrib>NEGISHI Kaori</creatorcontrib><title>DETERIORATION TESTING DEVICE AND DETERIORATION TESTING METHOD</title><description>The present invention comprises: a light source (16) that irradiates a polymer-material specimen (21) with light; a bending mechanism (19) that switches between extending and bending the specimen (21); an imaging unit (22) that captures an image of the specimen (21); and an assessment unit (32) that, on the basis of the image captured by the imaging unit (22), assesses whether the specimen (21) has deteriorated.
La présente invention comprend : une source de lumière (16) qui émet un échantillon de matériau polymère (21) avec de la lumière ; un mécanisme de flexion (19) qui commute entre l'extension et la flexion de l'échantillon (21) ; une unité d'imagerie (22) qui capture une image de l'échantillon (21) ; et une unité d'évaluation (32) qui, sur la base de l'image capturée par l'unité d'imagerie (22), évalue si l'échantillon (21) s'est détérioré.
高分子材料の試験体(21)に光を照射する光源(16)と、試験体(21)の伸長、屈曲を切り替える屈曲機構(19)と、試験体(21)を撮像する撮像部(22)と、撮像部(22)で撮像された画像に基づいて、試験体(21)の劣化を判定する判定部(32)と、を備える。</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB1cQ1xDfL0D3IM8fT3UwhxDQ7x9HNXcHEN83R2VXD0c1HArsDXNcTD34WHgTUtMac4lRdKczMou7mGOHvophbkx6cWFyQmp-allsSH-xsZGJkYGpoZmxg7GhoTpwoA948q-g</recordid><startdate>20240606</startdate><enddate>20240606</enddate><creator>MIWA Takashi</creator><creator>FUJIMOTO Norihiro</creator><creator>SUGIYAMA Akira</creator><creator>TORIMOTO Manami</creator><creator>NEGISHI Kaori</creator><scope>EVB</scope></search><sort><creationdate>20240606</creationdate><title>DETERIORATION TESTING DEVICE AND DETERIORATION TESTING METHOD</title><author>MIWA Takashi ; FUJIMOTO Norihiro ; SUGIYAMA Akira ; TORIMOTO Manami ; NEGISHI Kaori</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2024116343A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; jpn</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MIWA Takashi</creatorcontrib><creatorcontrib>FUJIMOTO Norihiro</creatorcontrib><creatorcontrib>SUGIYAMA Akira</creatorcontrib><creatorcontrib>TORIMOTO Manami</creatorcontrib><creatorcontrib>NEGISHI Kaori</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MIWA Takashi</au><au>FUJIMOTO Norihiro</au><au>SUGIYAMA Akira</au><au>TORIMOTO Manami</au><au>NEGISHI Kaori</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DETERIORATION TESTING DEVICE AND DETERIORATION TESTING METHOD</title><date>2024-06-06</date><risdate>2024</risdate><abstract>The present invention comprises: a light source (16) that irradiates a polymer-material specimen (21) with light; a bending mechanism (19) that switches between extending and bending the specimen (21); an imaging unit (22) that captures an image of the specimen (21); and an assessment unit (32) that, on the basis of the image captured by the imaging unit (22), assesses whether the specimen (21) has deteriorated.
La présente invention comprend : une source de lumière (16) qui émet un échantillon de matériau polymère (21) avec de la lumière ; un mécanisme de flexion (19) qui commute entre l'extension et la flexion de l'échantillon (21) ; une unité d'imagerie (22) qui capture une image de l'échantillon (21) ; et une unité d'évaluation (32) qui, sur la base de l'image capturée par l'unité d'imagerie (22), évalue si l'échantillon (21) s'est détérioré.
高分子材料の試験体(21)に光を照射する光源(16)と、試験体(21)の伸長、屈曲を切り替える屈曲機構(19)と、試験体(21)を撮像する撮像部(22)と、撮像部(22)で撮像された画像に基づいて、試験体(21)の劣化を判定する判定部(32)と、を備える。</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | DETERIORATION TESTING DEVICE AND DETERIORATION TESTING METHOD |
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