DEVICE DEFECT DATA RULE BASE CONSTRUCTION METHOD AND DEVICE DEFECT CORRELATION ANALYSIS METHOD

A device defect data rule base construction method and apparatus, and a computer device and a storage medium. The device defect data rule base construction method comprises: acquiring a set of original device defect data; extracting a set of device defect features from the set of original device defect data; performing defect grading prediction on the set of device defect features, so as to obtain a device defect grade prediction result; performing correlation analysis on the set of device defect features and the device defect grade prediction result, so as to obtain a correlation between defect features, defect influence factors and element modules; and constructing a device defect data rule base on the basis of the correlation. Further provided in the present application are a device defect correlation analysis method and apparatus, and a computer device and a storage medium. The device defect correlation analysis method comprises: acquiring device defect data, and matching the device defect data in a devic