INDUSTRIAL EQUIPMENT ABNORMALITY DETECTION DEVICE AND SYSTEM USING DEEP LEARNING, MACHINE LEARNING, AND STATISTICAL MODEL

Disclosed are an industrial equipment abnormality detection device and system using deep learning, machine learning, and a statistical model. An aspect of the present embodiment provides an abnormality detection device for detecting an abnormality occurring in industrial equipment, the device compri...

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Bibliographische Detailangaben

Hauptverfasser:	KANG, Eun Yeong, KWAK, Ji Hoon, KOO, Bon Gyeong, LEE, Seung Min, JEON, Myeong Ho, PARK, Jung Ho, BAE, Jung Yoon, CHOI, Ho Jin
Format:	Patent
Sprache:	eng ; fre ; kor
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING
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