PROBE CARD, PROBE PIN FOR PROBE CARD, GUIDE PLATE FOR PROBE CARD, AND METHOD FOR MANUFACTURING SAME

The present invention relates to a probe card for inspecting defects of an inspection target, a probe pin for a probe card configured to contact the inspection target, a guide plate for a probe card configured to guide a probe pin inserted therein, and a method for manufacturing same. More particula...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SONG, Byung Chang, SHIM, Yun Hee, KIM, Dong Il, OH, Tae Seung
Format:	Patent
Sprache:	eng ; fre ; kor
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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