BEAM MEASUREMENT METHOD AND RELATED DEVICE
Disclosed in the present application is a beam measurement method and a related device, which are used for making a terminal perform beam measurement only when the terminal is scanned by a beam in an adjacent region, thereby preventing resources of the terminal from being wasted. The method of the p...
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Format: | Patent |
Sprache: | chi ; eng ; fre |
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Zusammenfassung: | Disclosed in the present application is a beam measurement method and a related device, which are used for making a terminal perform beam measurement only when the terminal is scanned by a beam in an adjacent region, thereby preventing resources of the terminal from being wasted. The method of the present application comprises: a first satellite base station acquiring a measurement event, wherein the measurement event comprises a target time period, the target time period is determined according to location information of a terminal, ephemeris information of a second satellite base station and a beam scanning rule of the second satellite base station, and a target beam of the second satellite base station scans the terminal within the target time period; and the first satellite base station sending the measurement event to the terminal, wherein the measurement event is used by the terminal to measure the target beam within the target time period, and the first satellite base station is a serving satellite bas |
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