SIX-SURFACE TESTING MECHANISM AND TESTING DEVICE

A six-surface testing mechanism and a testing device, which belong to the technical field of testing. The six-surface testing mechanism comprises: a support; a carrying assembly (1); a suction assembly, which is provided with a first suction member (2) and a second suction member (3); and testing assemblies, which have a first testing assembly (4) and a second testing assembly (5), wherein the first testing assembly (4) is arranged corresponding to the first suction member (2), and the second testing assembly (5) is arranged corresponding to the second suction member (3). A suction port on a first working end face of the first suction member (2) suctions, by means of air pressure, a chip to be tested; the first testing assembly (4) tests front, rear, left, right and upper surfaces of said chip; and the second suction member (3) is used in cooperation with the second testing assembly (5) to test a lower surface of said chip, wherein the second suction member (3) suctions an upper surface of said chip, such tha