WAVELENGTH MEASUREMENT DEVICE, DATA PROCESSING DEVICE, WAVELENGTH MEASUREMENT METHOD AND PROGRAM

Provided are: a wavelength measurement device which is capable of contributing to efficient measurement by shortening measurement time when measuring a representative wavelength of each light-emitting element chip by causing a plurality of light-emitting element chips included in a measurement targe...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HIRAO Yusuke, OKI Makoto
Format:	Patent
Sprache:	eng ; fre ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!