ULTRA-HIGH SPATIAL RESOLUTION STRUCTURED LIGHT SCANNER AND APPLICATIONS THEREOF

A structured light three-dimensional scanner (SLS) is described for digitally reconstructing surface topography useful in additive manufacturing (AM) processes. In an example, the structured light three-dimensional scanner includes a first imaging device having a first lens, a second imaging device...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG, Rongxuan, KONG, Zhenyu
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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