PROBE AND INTEGRATED CIRCUIT TEST DEVICE

A probe and an integrated circuit test device. The probe comprises two first contact sections, a first connecting section, a second connecting section, and a second contact section, the two first contact sections being spaced apart. The upper ends of the two first contact sections are each provided...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	DUAN, Chaoyi, ZHOU, Chuang, JIANG, Wei, TAO, Shan
Format:	Patent
Sprache:	chi ; eng ; fre
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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