PROBE AND INTEGRATED CIRCUIT TEST DEVICE
A probe and an integrated circuit test device. The probe comprises two first contact sections, a first connecting section, a second connecting section, and a second contact section, the two first contact sections being spaced apart. The upper ends of the two first contact sections are each provided...
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Format: | Patent |
Sprache: | chi ; eng ; fre |
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Zusammenfassung: | A probe and an integrated circuit test device. The probe comprises two first contact sections, a first connecting section, a second connecting section, and a second contact section, the two first contact sections being spaced apart. The upper ends of the two first contact sections are each provided with a contact surface used for making contact with a tested IC, and the two first contact sections can both elastically deform in the horizontal direction. The second connecting section comprises a plurality of straight sections and a plurality of bent sections, the plurality of straight sections and the plurality of bent sections being successively connected end to end, and the plurality of straight sections all extending in the length direction of the first connecting section. The bent section at the head end of the second connecting section is connected to the first connecting section, the second connecting section being elastically arranged.
Une sonde et un dispositif de test de circuit intégré. La sonde compr |
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