SUBSTRATE FOR INSPECTION DEVICE, INSPECTION DEVICE, AND METHOD FOR MANUFACTURING INSPECTION DEVICE

Provided is a substrate for an inspection device, the substrate having an average thickness of 250 µm to 350 µm and a density of 0.25×106g/m3 to 0.40×106g/m3. L'invention concerne un substrat pour un dispositif d'inspection, ce substrat ayant une épaisseur moyenne de 250 µm à 350 µm et une...

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Bibliographische Detailangaben
Hauptverfasser:	MONJU, Takuya, HIRAKAWA, Manabu
Format:	Patent
Sprache:	eng ; fre ; jpn
Schlagworte:	BEER BIOCHEMISTRY CHEMISTRY COMPOSITIONS OR TEST PAPERS THEREFOR CONDITION-RESPONSIVE CONTROL IN MICROBIOLOGICAL ORENZYMOLOGICAL PROCESSES ENZYMOLOGY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING OR TESTING PROCESSES INVOLVING ENZYMES, NUCLEICACIDS OR MICROORGANISMS METALLURGY MICROBIOLOGY MUTATION OR GENETIC ENGINEERING PHYSICS PROCESSES OF PREPARING SUCH COMPOSITIONS SPIRITS TESTING VINEGAR WINE
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Beschreibung
Zusammenfassung:	Provided is a substrate for an inspection device, the substrate having an average thickness of 250 µm to 350 µm and a density of 0.25×106g/m3 to 0.40×106g/m3. L'invention concerne un substrat pour un dispositif d'inspection, ce substrat ayant une épaisseur moyenne de 250 µm à 350 µm et une densité de 0,25 × 106g/m3 à 0,40 × 106g/m3. 平均厚みが２５０μｍ以上３５０μｍ以下であり、かつ密度が０．２５×１０６ｇ／ｍ３以上０．４０×１０６ｇ／ｍ３以下である検査デバイス用基材である。