FULLY AUTOMATIC METHOD AND SYSTEM FOR TESTING READ AND WRITE FUNCTIONS OF DRAM STORAGE CELL

The present invention relates to the technical field of integrated circuit testing. Provided are a fully automatic method and system for testing read and write functions of a DRAM storage cell. The method comprises the following steps: acquiring a silk screen image of a chip to be tested, and performing recognition on the silk screen image using a ResNet, so as to obtain silk screen information; reading, according to the silk screen information and from a preset database, a read and write function test method that matches the silk screen information, and transmitting the read and write function test method to an ATE; and electrically connecting the ATE to said chip, and the ATE performing a read and write function test on said chip according to the received read and write function test method. In the present invention, the automation of the read and write function test work for a DRAM storage cell is realized, the efficiency of the read and write function test work is effectively increased, and a relatively h