ENHANCED DUAL-PASS AND MULTI-PASS PARTICLE DETECTION

A particle detection system may include a light source, a first beam splitter, a particle interrogation zone, a reflecting surface, a second beam splitter, a first photodetector, and a second photodetector. The first beam splitter may be configured to split the source beam into an interrogation beam...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SEHLER, Dwight, KNOLLENBERG, Brian A, MOGHADDAM, Mehran Vahdani
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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