MULTIFUNCTIONAL COMPLEX FOREIGN MATTER INSPECTION DEVICE EMPLOYING TERAHERTZ TECHNOLOGY AND HYPERSPECTRAL TECHNOLOGY
Disclosed is a multifunctional complex foreign matter inspection device employing a terahertz technology and a hyperspectral technology. The multifunctional complex foreign matter inspection device of the present invention is a multifunctional complex foreign matter inspection device which employs a...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; kor |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | Disclosed is a multifunctional complex foreign matter inspection device employing a terahertz technology and a hyperspectral technology. The multifunctional complex foreign matter inspection device of the present invention is a multifunctional complex foreign matter inspection device which employs a terahertz technology and a hyperspectral technology to sort out foreign matter contained in a raw material.
L'invention concerne un dispositif d'inspection de corps étranger complexe multifonctionnel utilisant une technologie térahertz et une technologie hyperspectrale. Le dispositif d'inspection de corps étranger complexe multifonctionnel de la présente invention est un dispositif d'inspection de corps étranger complexe multifonctionnel qui utilise une technologie térahertz et une technologie hyperspectrale pour trier des corps étrangers contenus dans une matière première.
테라헤르츠 기술과 초분광 기술을 적용한 다기능 복합 이물질 검사 장치가 개시된다. 본 발명의 다기능 복합 이물질 검사 장치는, 원료에 포함된 이물질을 선별하는 테라헤르츠 기술과 초분광 기술을 적용한 다기능 복합 이물질 검사 장치이다. |
|---|