METHOD FOR PROVIDING POSITION INFORMATION FOR RETRIEVING A TARGET POSITION IN A MICROSCOPIC SAMPLE, METHOD FOR EXAMINING AND/OR PROCESSING SUCH A TARGET POSITION AND MEANS FOR IMPLEMENTING THESE METHODS
A method (500) for providing position information for retrieving a target position (101) in a microscopic sample (100) is provided, said method (500) comprising the steps of (a)providing (510) a first digital representation (200) of the sample (100) or a part thereof at a first resolution including...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng ; fre |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A method (500) for providing position information for retrieving a target position (101) in a microscopic sample (100) is provided, said method (500) comprising the steps of (a)providing (510) a first digital representation (200) of the sample (100) or a part thereof at a first resolution including the target position (101), (b) specifying (520) a first target position identifier (230) in the first digital representation (200) indicating the target position (101) at the first resolution, (c) acquiring (530) an image stack (260) in a region of the sample (100) including the target position (101) indicated by the first target position identifier (230), (d) providing (540) a second digital representation (300) at a second resolution higher than the first resolution on the basis of the image stack (260), (e) specifying (550) a second target position identifier (330) in the second digital representation (300) indicating the target position (101) at the second resolution, (f) specifying (560) a plurality of reference position identifiers (340a-340d) in the second digital detail representation (300) indicating positions of optically detectable reference markers at the second resolution, and (g) determining (570) a set (400) of geometric descriptors (400a-400h) describing spatial relations between the second target position identifier (330) and the plurality of reference position identifiers (340a-340d) to provide the position information. An apparatus, a microscopic examination arrangement (2000) and a computer program for performing the method are also provided, as well as a user interface (1000) for a microscopic examination arrangement (2000).
L'invention concerne un procédé (500) pour fournir des informations de position pour récupérer une position cible (101) dans un échantillon microscopique (100), ledit procédé (500) comprenant les étapes consistant à (a) fournir (510) une première représentation numérique (200) de l'échantillon (100) ou une partie de celle-ci à une première résolution comprenant la position cible (101), (b) spécifier (520) un premier identifiant de position cible (230) dans la première représentation numérique (200) indiquant la position cible (101) à la première résolution, (c) acquérir (530) un empilement d'images (260) dans une région de l'échantillon (100) comprenant la position cible (101) indiquée par le premier identifiant de position cible (230), (d) fournir (540) une seconde représentation numérique (300) à une seconde résolution |
---|