SURFACE CHARACTERIZATION MODULE AND SYSTEM INCLUDING SAME

Various embodiments of a module or apparatus for characterization of surface quality of a surface of a substrate and a system that includes such apparatus are disclosed. The apparatus includes a sensor configured to detect at least one property of the surface of the substrate or ambient environment...

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Bibliographische Detailangaben
Hauptverfasser:	LAHTI, Kaitlyn M, PRZEPASNIAK, Ann Marie, PLATTA, Marti Marie Joyer, LATRON, Damien, VANCE, Victor F, KOBE, Taylor J, KOBE, James J, NYLAND, Bridget E, BIERNATH, Rolf W
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE ADHESIVES AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING CHEMISTRY CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING CONVEYING DYES FUNCTIONAL ELEMENTS OF SUCH SYSTEMS HANDLING THIN OR FILAMENTARY MATERIAL HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS,CABLES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING METALLURGY MISCELLANEOUS APPLICATIONS OF MATERIALS MISCELLANEOUS COMPOSITIONS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS NATURAL RESINS NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL PACKING PAINTS PERFORMING OPERATIONS PHYSICS POLISHES REGULATING SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR SHAPING OR JOINING OF PLASTICS STORING TESTING TRANSPORTING USE OF MATERIALS AS ADHESIVES WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Beschreibung
Zusammenfassung:	Various embodiments of a module or apparatus for characterization of surface quality of a surface of a substrate and a system that includes such apparatus are disclosed. The apparatus includes a sensor configured to detect at least one property of the surface of the substrate or ambient environment and provide a value indicative of the at least one property, and a processor coupled to the sensor. The processor is configured to determine at least one surface quality parameter of the surface based upon the value provided by the sensor, and determine at least one processing parameter for a surface bonding application based upon the at least one surface quality parameter. L'invention concerne divers modes de réalisation d'un module ou d'un appareil pour la caractérisation de la qualité de surface d'une surface d'un substrat et d'un système qui comprend un tel appareil. L'appareil comprend un capteur configuré pour détecter au moins une propriété de la surface du substrat ou de l'environnement ambiant et fournir une valeur indicative de ladite propriété, ainsi qu'un processeur connecté au capteur. Le processeur est configuré pour déterminer au moins un paramètre de qualité de surface de la surface sur la base de la valeur fournie par le capteur, et déterminer au moins un paramètre de traitement pour une application de collage de surface sur la base dudit paramètre de qualité de surface.