METHOD FOR PRODUCING A PROBE CARD

Disclosed herein is a method for producing a probe card, the method comprising the steps: Providing a carrier board, wherein the surface of the carrier board has at least one probe guiding portion; and Generating a probe on the probe guiding portion by performing additive manufacturing with a conduc...

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Bibliographische Detailangaben
Hauptverfasser:	HEPP, Edgar, LIN, Kun-Hsien, SCHUERCH, Patrik, KOELMANS, Wabe
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ADDITIVE MANUFACTURING TECHNOLOGY ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING APPARATUS THEREFOR CHEMISTRY ELECTROFORMING ELECTROLYTIC OR ELECTROPHORETIC PROCESSES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES METALLURGY PERFORMING OPERATIONS PHYSICS PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	Disclosed herein is a method for producing a probe card, the method comprising the steps: Providing a carrier board, wherein the surface of the carrier board has at least one probe guiding portion; and Generating a probe on the probe guiding portion by performing additive manufacturing with a conductive material directly on the at least one probe guiding portion to generate the probe, wherein additive manufacturing comprises directly layering the conductive material on the probe guiding portion. L'invention concerne un procédé de production d'une carte sonde, le procédé comprenant les étapes consistant à : fournir une plaque de support, la surface de la plaque de support ayant au moins une partie de guidage de sonde ; et générer une sonde sur la partie de guidage de sonde en effectuant une fabrication additive avec un matériau conducteur directement sur la ou les parties de guidage de sonde pour générer la sonde, la fabrication additive comprenant la stratification directe du matériau conducteur sur la partie de guidage de sonde.