METHOD, SYSTEM AND APPARATUS FOR DETECTING DEVICE MALFUNCTIONS

An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the e...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	ASTVATSATUROV, Yuri
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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