IMPEDANCE MEASUREMENT FOR A HAPTIC LOAD

In some implementations, a measurement circuit may drive, using a first transistor, a first node of a haptic load. The measurement circuit may trigger a first comparator when a voltage driving the haptic load satisfies a first condition. The first comparator may have a first node connected, in paral...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SALAZAR, Nathaniel, ZAZZERA, Joshua, RUTKOWSKI, Joseph Dale, SHEN, Liangguo
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ALARM SYSTEMS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES ORDER TELEGRAPHS PHYSICS SIGNALLING SIGNALLING OR CALLING SYSTEMS TESTING
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