METHODS AND SYSTEMS FOR SINGLE-EVENT UPSET FAULT INJECTION TESTING

Fault injection testing for field programmable gate array (FPGA) devices including: interfacing with a FPGA device under test (DUT); imaging a configuration RAM (CRAM) of the FPGA DUT with a first configuration image to define a first operational function of the FPGA DUT where the CRAM includes a pl...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	FLEMING, Patrick, CLEBOWICZ, Brian, BYNES, James, LARA, Alfredo, KACHUCHE, Dale D, POLLACK, Neal, AMIN, Mustafa, LLORENS, Patrick, ROWE, William
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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