POLARIZATION UNIFORMITY MEASUREMENT METHOD FOR NON-UNIFORMLY TOTALLY POLARIZED LIGHT, APPLICATION, APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM

A polarization uniformity measurement method for non-uniformly totally polarized light, an application, an apparatus, an electronic device, and a storage medium. The method comprises: inputting a Stokes parameter distribution of a cross section of a non-uniformly totally polarized light beam; enabli...

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Hauptverfasser:	GONG, Yijia, SHEN, Heliang, ZOU, Kang, WANG, Guofa, CHEN, Kan, SHU, Xiaowu
Format:	Patent
Sprache:	chi ; eng ; fre
Schlagworte:	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	A polarization uniformity measurement method for non-uniformly totally polarized light, an application, an apparatus, an electronic device, and a storage medium. The method comprises: inputting a Stokes parameter distribution of a cross section of a non-uniformly totally polarized light beam; enabling, by means of calculation, the Stokes parameter distribution to correspond to a Poincaré sphere surface; performing surface fitting on a polarization state distribution on the Poincaré sphere surface by means of a spatial triangle surface fitting algorithm; calculating the sum SD of the areas of fitted triangle surfaces; and dividing SD by the total area S0 of a unit Poincaré sphere surface to obtain polarization uniformity of the non-uniformly totally polarized light. L'invention concerne un procédé de mesure d'uniformité de polarisation pour une lumière totalement polarisée non uniformément, une application, un appareil, un dispositif électronique et un support de stockage. Le procédé consiste à : entrer une di