RESIST PATTERN FORMING METHOD AND COMPOSITION FOR FORMING RESIST UNDERLAYER FILM

Provided is a resist pattern forming method with which it is possible to form a fine resist pattern for which pattern collapse and development residue are suppressed. This resist pattern forming method includes: a step for coating a composition for forming a resist underlayer film on a base material...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUZUKI Junya, KOMATSU Hiroyuki, TAJI Tomoya, FURUKAWA Taiichi
Format: Patent
Sprache:eng ; fre ; jpn
Schlagworte:
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