RE-SCAN OPTICAL SYSTEMS AND METHODS

This disclosure relates to a re-scan optical system for scanning a sample light spot over an imaging plane of an imaging system in order to form an image of a sample. The system comprises an illumination optical system for directing, and optionally focusing, illumination light at the sample therewith providing an illumination light spot at the sample. The illumination light spot causes sample light. The system further comprises a detection optical system for focusing at least part of the sample light onto an imaging plane of an imaging system herewith causing a sample light spot on the imaging plane. The system further comprises a light directing element for scanning the illumination light spot over and/or through the sample and de-scanning the sample light from the sample and scanning the sample light spot over said imaging plane of the imaging system. The detection optical system is configured to direct the de-scanned sample light along a light path running from the light directing element back to the light directing element so that the light directing element can perform said scanning of the sample light spot over said imaging plane. Further, -the light path is provided with a prism configured to invert and/or revert the sample light, and/or -the re-scan optical system comprises one or more optical elements that is or are configured to cause at least two foci of the sample light in said light path, and/or -the light path is provided with a sample light deflecting prism configured to deflect the sample light without inverting the sample light and/or configured to deflect the sample light without reverting the sample light. Cette divulgation concerne un système optique de rébalayage pour balayer un point lumineux d'échantillon sur un plan d'imagerie d'un système d'imagerie afin de former une image d'un échantillon. Le système comprend un système optique d'éclairage pour orienter, et éventuellement focaliser, une lumière d'éclairage au niveau de l'échantillon, fournissant ainsi un point lumineux d'éclairage au niveau de l'échantillon. Le point lumineux d'éclairage provoque la lumière d'échantillon. Le système comprend en outre un système optique de détection pour focaliser au moins une partie de la lumière d'échantillon sur un plan d'imagerie d'un système d'imagerie, ce qui amène un point lumineux d'échantillon sur le plan d'imagerie. Le système comprend en outre un élément d'orientation de lumière destiné à balayer le point lumineux d'éclairage sur et/ou