METHOD OF DETERMINATION OF METROLOGICAL CHARACTERISTICS OF INSTRUMENT CHANNEL (VARIANTS)

In first variant, the method of determination of instruments channels (IC) metrological characteristics (MC) comprising input of reference value Xref to the measuring instrument (MI), the suspension of output of measuring signal, value of which depends functionally on the measured parameter, transmi...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	KALASHNIKOV, Aleksandr Aleksandrovich
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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