METHOD AND CIRCUIT FOR MEASURING RETENTION TIME OF TIME SEQUENCE UNIT

A method and circuit for measuring the retention time of a time sequence unit. The method comprises: determining a first period value, a second period value and a third period value of a clock signal separately, wherein the first period value is a critical period of the clock signal when a time sequence unit (170) to be measured is able to correctly receive a data signal under a first test path, the second period value is a critical period of the clock signal when a delay detection module (140) is able to correctly receive the data signal under a second test path, and the third period value is a critical period of the clock signal when the delay detection module (140) is able to correctly receive the data signal under a third test path (S210); and determining the retention time of the time sequence unit according to the first period value, the second period value and the third period value (S220). Procédé et circuit pour mesurer le temps de rétention d'une unité de séquence temporelle. Le procédé comprend : l