X-RAY FLUORESCENCE SPECTROMETER

A total analysis time indicating means provided in a scanning X-ray fluorescence spectrometer according to the present invention measures, for each kind of a sample to be analyzed, a reference sample for which the content of each component is known as a reference value, to obtain measured intensity...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NAGOSHI, Yasuhiko, KATAOKA, Yoshiyuki
Format:	Patent
Sprache:	eng ; fre ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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