METHOD OF DETERMINING AN INTERFACE HEIGHT OF AN INTERFACE BETWEEN AN UPPER AND A LOWER LAYER COMPRISED IN A THICKENER
A Method of determining an interface height (h) of an interface (1) between an upper layer (3) and a lower layer (5) comprised in a container (7) of a thickener (9), wherein said thickener (9) is designed to perform a thickening process, wherein particles suspended in a medium supplied to the contai...
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Format: | Patent |
Sprache: | eng ; fre |
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Zusammenfassung: | A Method of determining an interface height (h) of an interface (1) between an upper layer (3) and a lower layer (5) comprised in a container (7) of a thickener (9), wherein said thickener (9) is designed to perform a thickening process, wherein particles suspended in a medium supplied to the container (7) are separated from a liquid comprised in the medium, and wherein said upper layer (3) comprises said liquid floating on said lower layer (5) comprising said particles, is described, which improves the availability of the determination of the interface height. This method comprises the method steps of: measuring said interface height (h) with an interface level measurement device (L) installed on said thickener (9) during time periods, when conditions prevailing at said thickener (9) permit performance of these measurements, with a group of measurement devices installed on said thickener (9) measuring process variables (v1,..., vn) related to the thickening process performed by the thickener (9), and at least once calculating and providing a calculated interface height (hc) with a calculating unit (35) based on said measured process variables (v1,..., vn) provided to said calculating unit (35), wherein said calculating unit (35) is designed to learn said calculation of said calculated interface height (hc) based on said measured interface heights (hm) and said measured process variables (v1,..., vn) measured during at least one of said time periods and provided by said interface level measurement device (L) and said measurement devices.
L'invention concerne un procédé de détermination d'une hauteur d'interface (h) d'une interface (1) entre une couche supérieure (3) et une couche inférieure (5) comprise dans un récipient (7) d'un décanteur (9). Ledit décanteur (9) est conçu pour effectuer un processus d'épaississement, des particules en suspension dans un milieu fourni au récipient (7) sont séparées d'un liquide compris dans le milieu, et ladite couche supérieure (3) comprend ledit liquide flottant sur ladite couche inférieure (5) comprenant lesdites particules, ce qui améliore la disponibilité de la détermination de la hauteur d'interface. Ledit procédé consiste : à mesurer ladite hauteur d'interface (h) à l'aide d'un dispositif de mesure de niveau d'interface (L) installé sur ledit décanteur (9) pendant des périodes de temps, lorsque des conditions régnant au niveau dudit décanteur (9) permettent la réalisation desdites mesures, à l'aide d'un groupe de d |
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