METHOD FOR DETERMINING A PRODUCTION PARAMETER FOR A RESISTIVE RANDOM-ACCESS MEMORY CELL

The invention relates to a method for determining at least one value (tTE_opt, tOX_opt, Xopt) of at least one production parameter (tTE, tOX, x) for a resistive memory cell, the resistive memory cell comprising a thin-film stack, said method comprising the following steps: - providing (S1) a plurali...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MOLAS, Gabriel, NODIN, Jean-François, REGEV, Amir, CASTELLAN, Gaël, PICCOLBONI, Guiseppe
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
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