INSPECTION SYSTEM WITH IMPROVED CLEANING

The present invention relates to a system for inspecting (100) a glass substrate (S), comprising conveying means (102) for moving said glass substrate, a first cleaning device (104) arranged to clean a first surface of the glass substrate, and a first visual control device (103a) for taking a post-w...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	REMEUR, Laurent, GAGNON, Emerson, FAYOLLE, Philippe, RYBARCZYK, Théo
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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