INSPECTION SYSTEM WITH IMPROVED CLEANING

The present invention relates to a system for inspecting (100) a glass substrate (S), comprising conveying means (102) for moving said glass substrate, a first cleaning device (104) arranged to clean a first surface of the glass substrate, and a first visual control device (103a) for taking a post-w...

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Bibliographische Detailangaben
Hauptverfasser:	REMEUR, Laurent, GAGNON, Emerson, FAYOLLE, Philippe, RYBARCZYK, Théo
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	The present invention relates to a system for inspecting (100) a glass substrate (S), comprising conveying means (102) for moving said glass substrate, a first cleaning device (104) arranged to clean a first surface of the glass substrate, and a first visual control device (103a) for taking a post-washing image of the cleaned surface of the glass substrate, characterized in that said inspection system further comprises a second cleaning device (104) arranged to clean a second surface of the glass substrate. La présente invention concerne un système d'inspection (100) d'un substrat verrier (S) comprenant des moyens de convoyage (102) pour faire défiler ledit substrat verrier, un premier dispositif de nettoyage (104) agencé pour nettoyer une première surface du substrat verrier et un premier dispositif de contrôle visuel (103a) pour prendre une image post-lavage de la surface nettoyée du substrat verrier, caractérisé en ce que ledit système d'inspection comprend en outre un second dispositif de nettoyage (104) agencé pour nettoyer une seconde surface du substrat verrier.