SELF-REFERENCING TERAHERTZ ELECTRO-OPTIC SAMPLING SPECTRAL INTERFEROMETER AND MEASUREMENT SYSTEM
A self-referencing terahertz electro-optic sampling spectral interferometer and measurement system. The self-referencing terahertz electro-optic sampling spectral interferometer comprises a pulse stretcher (102), a broadband half-wave plate (103), lenses (106, 110), a terahertz electro-optic crystal...
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| creator | ZENG, Xuanke ZHENG, Shuiqin LIU, Junmin SHANGGUAN, Huangcheng XU, Shixiang CAI, Yi |
| description | A self-referencing terahertz electro-optic sampling spectral interferometer and measurement system. The self-referencing terahertz electro-optic sampling spectral interferometer comprises a pulse stretcher (102), a broadband half-wave plate (103), lenses (106, 110), a terahertz electro-optic crystal (109), a birefringent crystal (111), a linear polarizer (112), and a spectrometer (113). The optical elements have a smart structural design related to self-referencing interference, and chirped pulses are employed, on the basis of electro-optic sampling and the spectral interference principle, as a probe to complete a single measurement of high-intensity terahertz time-domain spectroscopy.
La présente invention concerne un interféromètre spectral à échantillonnage électro-optique térahertz à autoréférence et un système de mesure. L'interféromètre spectral à échantillonnage électro-optique térahertz à autoréférence comprend un extenseur d'impulsions (102), une lame demi-onde à large bande (103), des lentilles (106 |
| format | Patent |
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La présente invention concerne un interféromètre spectral à échantillonnage électro-optique térahertz à autoréférence et un système de mesure. L'interféromètre spectral à échantillonnage électro-optique térahertz à autoréférence comprend un extenseur d'impulsions (102), une lame demi-onde à large bande (103), des lentilles (106</description><language>chi ; eng ; fre</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181129&DB=EPODOC&CC=WO&NR=2018214158A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25555,76308</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181129&DB=EPODOC&CC=WO&NR=2018214158A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZENG, Xuanke</creatorcontrib><creatorcontrib>ZHENG, Shuiqin</creatorcontrib><creatorcontrib>LIU, Junmin</creatorcontrib><creatorcontrib>SHANGGUAN, Huangcheng</creatorcontrib><creatorcontrib>XU, Shixiang</creatorcontrib><creatorcontrib>CAI, Yi</creatorcontrib><title>SELF-REFERENCING TERAHERTZ ELECTRO-OPTIC SAMPLING SPECTRAL INTERFEROMETER AND MEASUREMENT SYSTEM</title><description>A self-referencing terahertz electro-optic sampling spectral interferometer and measurement system. The self-referencing terahertz electro-optic sampling spectral interferometer comprises a pulse stretcher (102), a broadband half-wave plate (103), lenses (106, 110), a terahertz electro-optic crystal (109), a birefringent crystal (111), a linear polarizer (112), and a spectrometer (113). The optical elements have a smart structural design related to self-referencing interference, and chirped pulses are employed, on the basis of electro-optic sampling and the spectral interference principle, as a probe to complete a single measurement of high-intensity terahertz time-domain spectroscopy.
La présente invention concerne un interféromètre spectral à échantillonnage électro-optique térahertz à autoréférence et un système de mesure. L'interféromètre spectral à échantillonnage électro-optique térahertz à autoréférence comprend un extenseur d'impulsions (102), une lame demi-onde à large bande (103), des lentilles (106</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNy00KwjAUBOBuXIh6hweuA6YqdBvi1BbyU5InoptaJK5EC_X-2IIHcDXD8M08u0WYUgSUCHC6dkdiBFUh8JVgoDl44RuuNUVlGzOB2EyzMlS70Y5HbzEWUu5AFiqeAiwcU7xEhl1ms0f3HNLql4tsXYJ1JVL_btPQd_f0Sp_27PONLHK5k_tCye1_6gupOjUL</recordid><startdate>20181129</startdate><enddate>20181129</enddate><creator>ZENG, Xuanke</creator><creator>ZHENG, Shuiqin</creator><creator>LIU, Junmin</creator><creator>SHANGGUAN, Huangcheng</creator><creator>XU, Shixiang</creator><creator>CAI, Yi</creator><scope>EVB</scope></search><sort><creationdate>20181129</creationdate><title>SELF-REFERENCING TERAHERTZ ELECTRO-OPTIC SAMPLING SPECTRAL INTERFEROMETER AND MEASUREMENT SYSTEM</title><author>ZENG, Xuanke ; ZHENG, Shuiqin ; LIU, Junmin ; SHANGGUAN, Huangcheng ; XU, Shixiang ; CAI, Yi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2018214158A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng ; fre</language><creationdate>2018</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZENG, Xuanke</creatorcontrib><creatorcontrib>ZHENG, Shuiqin</creatorcontrib><creatorcontrib>LIU, Junmin</creatorcontrib><creatorcontrib>SHANGGUAN, Huangcheng</creatorcontrib><creatorcontrib>XU, Shixiang</creatorcontrib><creatorcontrib>CAI, Yi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZENG, Xuanke</au><au>ZHENG, Shuiqin</au><au>LIU, Junmin</au><au>SHANGGUAN, Huangcheng</au><au>XU, Shixiang</au><au>CAI, Yi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SELF-REFERENCING TERAHERTZ ELECTRO-OPTIC SAMPLING SPECTRAL INTERFEROMETER AND MEASUREMENT SYSTEM</title><date>2018-11-29</date><risdate>2018</risdate><abstract>A self-referencing terahertz electro-optic sampling spectral interferometer and measurement system. The self-referencing terahertz electro-optic sampling spectral interferometer comprises a pulse stretcher (102), a broadband half-wave plate (103), lenses (106, 110), a terahertz electro-optic crystal (109), a birefringent crystal (111), a linear polarizer (112), and a spectrometer (113). The optical elements have a smart structural design related to self-referencing interference, and chirped pulses are employed, on the basis of electro-optic sampling and the spectral interference principle, as a probe to complete a single measurement of high-intensity terahertz time-domain spectroscopy.
La présente invention concerne un interféromètre spectral à échantillonnage électro-optique térahertz à autoréférence et un système de mesure. L'interféromètre spectral à échantillonnage électro-optique térahertz à autoréférence comprend un extenseur d'impulsions (102), une lame demi-onde à large bande (103), des lentilles (106</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | SELF-REFERENCING TERAHERTZ ELECTRO-OPTIC SAMPLING SPECTRAL INTERFEROMETER AND MEASUREMENT SYSTEM |
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