A TESTING ASSEMBLY AND METHOD FOR TESTING ELECTRICAL COMPONENTS

A method of testing a transistor component, the method comprising the step of, (a) capturing a first image of the transistor component which is to be positioned into a nest for testing; (b) identifying from the first image the locations of the source and gate of the transistor component; (c) holding the transistor component using a component handling head on a rotatable turret, (d) using an alignment device to move the transistor component into a position on the component handling head such that the component handling head can deliver the component into a position on the nest wherein all of said plurality of electrical contacts on the base-plate of nest will make electrical contact with the drain of the transistor component, and a portion of the plurality of electrical contacts on the cover-plate of nest will make electrical contact with the gate of the transistor component and the remaining electrical contacts on the cover-plate of nest will make electrical contact with the source of the transistor component, when the cover is moved to close the nest; (e) delivering the transistor component to the nest so that all of said plurality of electrical contacts on the base-plate of nest make electrical contact with the drain of the transistor component; (f) moving the nest cover-plate to overlay the base-plate to close the nest and a portion of the plurality of electrical contacts on the cover-plate of nest will make electrical contact with the gate of the transistor component and the remaining electrical contacts on the cover-plate of nest will make electrical contact with the source of the transistor component; (g) performing testing of the transistor component. There is further provided a corresponding testing assembly. La présente invention concerne un procédé de test d'un composant de transistor, le procédé comprenant les étapes consistant, (a) à capturer une première image du composant de transistor qui doit être positionnée dans un nid à des fins de test ; (b) à identifier, à partir de la première image, les emplacements de la source et de la grille du composant de transistor ; (c) à maintenir le composant de transistor à l'aide d'une tête de manipulation de composant sur une tourelle rotative, (d) à utiliser un dispositif d'alignement pour placer le composant de transistor dans une position sur la tête de manipulation de composant de telle sorte que la tête de manipulation de composant peut fournir le composant dans une position sur le nid, l'ensemble de