METHOD FOR DETERMINING/CORRECTING LOCAL DEFECTS IN SECTIONS OF A SAMPLE AND ASSOCIATED DEVICES

The present invention concerns a method for determining/correcting defects in section of a sample, the defects being generated when sectioning the sample into sections of the sample, the method being based on spectroscopy. La présente invention concerne un procédé de détermination/correction de défa...

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Bibliographische Detailangaben
Hauptverfasser:	RECUR, Benoît, PETIBOIS, Cyril
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COLORIMETRY COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	The present invention concerns a method for determining/correcting defects in section of a sample, the defects being generated when sectioning the sample into sections of the sample, the method being based on spectroscopy. La présente invention concerne un procédé de détermination/correction de défauts dans une section d'un échantillon, les défauts étant générés lors du sectionnement de l'échantillon en sections de l'échantillon, le procédé étant basé sur la spectroscopie.