METHOD AND SYSTEM FOR EPICENTRE POSITIONING IN MICROSEISM MONITORING

A method and system for epicentre positioning in microseism monitoring. The method comprises: acquiring a monitoring area and each observation point in the monitoring area (S101); dividing the monitoring area into N grids according to epicentre positioning accuracy, wherein side length of a grid uni...

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Bibliographische Detailangaben
Hauptverfasser: LIU, Congwei, LI, Fei, LI, Yanpeng, JIN, Qihu, XU, Gang, CHU, Fangdong
Format: Patent
Sprache:chi ; eng ; fre
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Zusammenfassung:A method and system for epicentre positioning in microseism monitoring. The method comprises: acquiring a monitoring area and each observation point in the monitoring area (S101); dividing the monitoring area into N grids according to epicentre positioning accuracy, wherein side length of a grid unit of an i-th grid is D/2 i-1, i=1,...N, and D being an initial edge length of the grid unit (S102); searching for all nodes in a first grid to acquire a node meeting a preset condition (S103); starting from i=2, determining and searching for a node meeting a first preset requirement in the i-th grid to obtain a node therein which meets the preset condition, continuing until completing search of the Nth grid, wherein a node in the Nth grid which meets the preset condition is an epicentre position (S104). Said method and system for epicentre positioning may implement high-precision positioning of a microseism epicentre and have a small number of calculations. L'invention concerne un procédé et un système de positionn