DIFFRACTION METHOD FOR MEASURING LINEAR SIZE OF OBJECT

The invention relates to monitoring/measurement technology and may be used for measuring the linear (transverse) size of various objects, for instance microwire or fiber, gaps or slits, micro-apertures and round screens having micron-sizes, and also suspensions of microparticles or biological suspen...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	FEFILOV, Georgij Dmitrievich, KHRAMOV, Valery Yurevich
Format:	Patent
Sprache:	eng ; fre ; rus
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!