TEST PROBE OF DETECTION APPARATUS
A test probe (20) of a detection apparatus. The test probe comprises a probe sheath (10) and the probe (20). The probe sheath (10) comprises a first connecting end (11), a second connecting end (12) and a connecting lead (13). The connecting lead (13) is flexibly connected between the first connecti...
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Format: | Patent |
Sprache: | chi ; eng ; fre |
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Zusammenfassung: | A test probe (20) of a detection apparatus. The test probe comprises a probe sheath (10) and the probe (20). The probe sheath (10) comprises a first connecting end (11), a second connecting end (12) and a connecting lead (13). The connecting lead (13) is flexibly connected between the first connecting end (11) and the second connecting end (12). The probe (20) is inserted on the second connecting end (12). The first connecting end (11) is welded onto a test PCB board (30) and forms a first signal connection area on that position. Other signal connection areas are provided on the test PCB board (30). Since the connection lead (13) is flexibly connected between the first connecting end (11) and the second connecting end (12), when the probe is inserted on the second connecting end (12), the probe (20) can be inserted into the test PCB board (30) from other signal connection areas and from a long distance and with a large span, thereby completing a test task for a functional module on a test board under the test |
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