APPARATUS AND METHODS TO IMPACT TEST MATERIALS

APPARATUS AND METHODS TO IMPACT TEST MATERIALS

Apparatus and methods for impact testing of a transparent substrate are provided. The apparatus includes a base (110) for receiving the transparent substrate (112), the base having a curved surface (124) about which the transparent substrate is bent by a first fixture (130) and a second fixture (132...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: REIMAN, Kevin Barry, EGBOIYI, Benedict Osobomen, STRINES, Brian Paul
Format: Patent
Sprache:eng ; fre
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Apparatus and methods for impact testing of a transparent substrate are provided. The apparatus includes a base (110) for receiving the transparent substrate (112), the base having a curved surface (124) about which the transparent substrate is bent by a first fixture (130) and a second fixture (132). An abrasive sheet (136) is disposed between the transparent substrate and an impacting object (138) which is released from above the substrate such that the force from the impacting object causes damage to the transparent substrate while the transparent substrate is bent about the curved surface. L'invention concerne un appareil et des procédés pour tester la résistance aux chocs d'un substrat transparent. L'appareil comprend une base (110) pour recevoir le substrat transparent (112), la base ayant une surface incurvée (124) autour de laquelle le substrat transparent est cintré par une première fixation (130) et une seconde fixation (132). Une feuille abrasive (136) est disposée entre le substrat transparent et un objet percutant (138) qui est libéré au-dessus du substrat de telle sorte que la force provenant de l'objet percutant entraîne l'endommagement du substrat transparent pendant que le substrat transparent est cintré autour de la surface incurvée.