METHODS AND APPARATUS FOR INTERFEROMETRIC INTERROGATION OF AN OPTICAL SENSOR

A high-speed interrogation system is provided for interferometric sensors, one example of which is an EFPI sensor, that operates based on spectral interference. The system uses a two mode operation that includes a lower speed, accurate absolute measurement mode and a higher speed, relative measureme...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	DAVIS, MATTHEW, PEDRAZZANI, JANET, RENEE, LALLY, EVAN, M
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A high-speed interrogation system is provided for interferometric sensors, one example of which is an EFPI sensor, that operates based on spectral interference. The system uses a two mode operation that includes a lower speed, accurate absolute measurement mode and a higher speed, relative measurement mode. The system achieves greater overall measurement accuracy and speed than known sensor interrogation approaches. Système d'interrogation haute vitesse pour des capteurs interférométriques, par exemple, pour un capteur EFPI qui fonctionne sur la base d'une interférence spectrale. Le système utilise un fonctionnement en deux modes qui comprend un mode basse vitesse à mesure précise absolue, et un mode haute vitesse à mesure relative. Le système permet d'atteindre une précision et une vitesse globales de mesure plus élevée que celle dont se rapproche n'importe quelle interrogation de capteur existante.