LIT METHOD AND SYSTEM FOR DETERMINING MATERIAL LAYER PARAMETERS OF A SAMPLE

Determining material parameters of a sample using lock-in thermography (LIT. Applying a non-harmonic test signal to the electrical circuit of the sample layer and imaging the sample layer using infrared sensor to obtain IR images of the sample layer while the non-harmonic test signal is applied to t...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SCHMIDT, CHRISTIAN, MEINHARDT-WILDEGGER, RAIKO
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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