STRAIN MAPPING IN TEM USING PRECESSION ELECTRON DIFFRACTION
A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanni...
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| creator | TAHERI, MITRA LENORE LEFF, ASHER CALVIN |
| description | A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanning. The data is then analyzed using local mis-orientation mapping and/or Nye's tensor analysis to provide information about local strain states.
Selon l'invention, un matériau échantillon est balayé avec un microscope électronique à transmission (MET) par de multiples passages ayant une taille prédéterminée à un angle prédéterminé. Chaque balayage selon un passage et un angle prédéterminés est comparé à un modèle, le modèle étant généré à partir de paramètres du matériau et du balayage. Les données sont ensuite analysées à l'aide d'une cartographie de désorientation locale et/ou d'une analyse du tenseur de Nye pour fournir des informations concernant des états de contrainte locaux. |
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Selon l'invention, un matériau échantillon est balayé avec un microscope électronique à transmission (MET) par de multiples passages ayant une taille prédéterminée à un angle prédéterminé. Chaque balayage selon un passage et un angle prédéterminés est comparé à un modèle, le modèle étant généré à partir de paramètres du matériau et du balayage. Les données sont ensuite analysées à l'aide d'une cartographie de désorientation locale et/ou d'une analyse du tenseur de Nye pour fournir des informations concernant des états de contrainte locaux.</description><language>eng ; fre</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE ; PHYSICS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20141127&DB=EPODOC&CC=WO&NR=2014190239A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20141127&DB=EPODOC&CC=WO&NR=2014190239A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TAHERI, MITRA LENORE</creatorcontrib><creatorcontrib>LEFF, ASHER CALVIN</creatorcontrib><title>STRAIN MAPPING IN TEM USING PRECESSION ELECTRON DIFFRACTION</title><description>A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanning. The data is then analyzed using local mis-orientation mapping and/or Nye's tensor analysis to provide information about local strain states.
Selon l'invention, un matériau échantillon est balayé avec un microscope électronique à transmission (MET) par de multiples passages ayant une taille prédéterminée à un angle prédéterminé. Chaque balayage selon un passage et un angle prédéterminés est comparé à un modèle, le modèle étant généré à partir de paramètres du matériau et du balayage. Les données sont ensuite analysées à l'aide d'une cartographie de désorientation locale et/ou d'une analyse du tenseur de Nye pour fournir des informations concernant des états de contrainte locaux.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAODgly9PRT8HUMCPD0c1cAMkNcfRVCg0GcgCBXZ9fgYE9_PwVXH1fnkCAgw8XTzS3I0TkEKMjDwJqWmFOcyguluRmU3VxDnD10Uwvy41OLCxKTU_NSS-LD_Y0MDE0MLQ2MjC0dDY2JUwUAjEwqUA</recordid><startdate>20141127</startdate><enddate>20141127</enddate><creator>TAHERI, MITRA LENORE</creator><creator>LEFF, ASHER CALVIN</creator><scope>EVB</scope></search><sort><creationdate>20141127</creationdate><title>STRAIN MAPPING IN TEM USING PRECESSION ELECTRON DIFFRACTION</title><author>TAHERI, MITRA LENORE ; LEFF, ASHER CALVIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2014190239A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2014</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TAHERI, MITRA LENORE</creatorcontrib><creatorcontrib>LEFF, ASHER CALVIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TAHERI, MITRA LENORE</au><au>LEFF, ASHER CALVIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>STRAIN MAPPING IN TEM USING PRECESSION ELECTRON DIFFRACTION</title><date>2014-11-27</date><risdate>2014</risdate><abstract>A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanning. The data is then analyzed using local mis-orientation mapping and/or Nye's tensor analysis to provide information about local strain states.
Selon l'invention, un matériau échantillon est balayé avec un microscope électronique à transmission (MET) par de multiples passages ayant une taille prédéterminée à un angle prédéterminé. Chaque balayage selon un passage et un angle prédéterminés est comparé à un modèle, le modèle étant généré à partir de paramètres du matériau et du balayage. Les données sont ensuite analysées à l'aide d'une cartographie de désorientation locale et/ou d'une analyse du tenseur de Nye pour fournir des informations concernant des états de contrainte locaux.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE PHYSICS TESTING |
| title | STRAIN MAPPING IN TEM USING PRECESSION ELECTRON DIFFRACTION |
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