NON-DESTRUCTIVE IMAGING OF CROP PLANTS

The present disclosure relates to methods for non-destructively assessing yield and/or stress tolerance in crop plants through the use of high-energy particle based imaging and analysis including X rays. Also provided are methods to non-destructively assess transgenic crop plants for the effects of...

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Bibliographische Detailangaben
Hauptverfasser:	LI, GUOFU, MORIARTY, TIMOTHY, MICHAEL, COPE, JASON
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present disclosure relates to methods for non-destructively assessing yield and/or stress tolerance in crop plants through the use of high-energy particle based imaging and analysis including X rays. Also provided are methods to non-destructively assess transgenic crop plants for the effects of a transgene on yield and/or on stress tolerance. La présente invention concerne des procédés d'estimation de façon non destructrice du rendement et/ou de la tolérance au stress dans des plantes en culture par l'intermédiaire de l'utilisation d'une imagerie à base de particules à haute énergie et d'une analyse comprenant des rayons X. L'invention concerne également des procédés d'estimation non destructrice de plantes en culture transgéniques pour les effets d'un transgène sur le rendement et/ou la tolérance au stress.