METHOD FOR INSPECTING FLAT PANEL

Disclosed is a method for inspecting a flat panel. The method for inspecting the flat panel includes the steps of: arranging a camera at a measurement location of the flat panel by horizontally moving at least one of the flat panel and the camera; automatically focusing the camera with respect to a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SON, JAI-HO, LEE, SANG-YOON, KANG, MIN-GU, LEE, HYUN-MIN, LIM, SSANG-GUN
Format:	Patent
Sprache:	eng ; fre ; kor
Schlagworte:	CALCULATING COMPUTING COUNTING DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY FREQUENCY-CHANGING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING
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Beschreibung
Zusammenfassung:	Disclosed is a method for inspecting a flat panel. The method for inspecting the flat panel includes the steps of: arranging a camera at a measurement location of the flat panel by horizontally moving at least one of the flat panel and the camera; automatically focusing the camera with respect to a measuring target of the flat panel at the measurement location; acquiring a plurality of images for the measuring target by vertically moving the camera within a set region on the basis of the present location of the camera when focusing the camera; selecting the image having the most definition for the measuring target among the acquired images; processing the selected image; and determining whether the measuring target is defective or not. L'invention porte sur un procédé pour inspecter un écran plat. Le procédé pour inspecter l'écran plat comprend les étapes consistant à : disposer une caméra en un emplacement de mesure de l'écran plat par déplacement horizontal de l'écran plat et/ou de la camera; focaliser automatiquement la caméra par rapport à une cible de mesure de l'écran plat à l'emplacement de mesure; acquérir une pluralité d'images pour la cible de mesure par déplacement vertical de la caméra à l'intérieur d'une région définie sur la base de l'emplacement actuel de la caméra lors de la focalisation de la caméra; sélectionner l'image ayant la plus grande définition pour la cible de mesure parmi les images acquises; traiter l'image sélectionnée; et déterminer si la cible de mesure est défectueuse ou non.