ENHANCED CONTROL IN SCAN TESTS OF INTEGRATED CIRCUITS WITH PARTITIONED SCAN CHAINS

A test controller implemented in an integrated circuit (IC) with partitioned scan chains provides enhanced control in performing scan tests. According to an aspect, a test controller can selectively control scan-in, scan-out and capture phases of scan tests for different scan chains of the IC to be...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NAKIDI, SRUJAN, K, RAVI, SRIVATHS, HALES, ALAN, D, PAREKHJI, RUBIN, A, TIWARI, RAJESH, K
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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