WAFER RECLAMATION COMPOSITIONS AND METHODS

Removal compositions and processes for removing at least one material layer from a rejected microelectronic device structure having same thereon. The removal composition preferably includes hydrofluoric acid. The composition achieves substantial removal of the material(s) to be removed while not dam...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KORZENSKI, MICHAEL, JIANG, PING, HAN, JIANWEN, LIU, JUN, MINSEK, DAVID, VISINTIN, PAMELA, ZHOU, RENJIE, HILGARTH, MONICA, KING, MACKENZIE
Format: Patent
Sprache:eng ; fre
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator KORZENSKI, MICHAEL
JIANG, PING
HAN, JIANWEN
LIU, JUN
MINSEK, DAVID
VISINTIN, PAMELA
ZHOU, RENJIE
HILGARTH, MONICA
KING, MACKENZIE
description Removal compositions and processes for removing at least one material layer from a rejected microelectronic device structure having same thereon. The removal composition preferably includes hydrofluoric acid. The composition achieves substantial removal of the material(s) to be removed while not damaging the layers to be retained, for reclaiming, reworking, recycling and/or reuse of said structure. Processes include the monitoring and modifying said compositions. L'invention concerne des compositions et procédés d'enlèvement destinés à enlever au moins une couche de matériau à partir d'une structure du dispositif micro-électronique rejetée ayant celle-ci dessus. La composition d'enlèvement comprend de préférence de l'acide fluorhydrique. La composition obtient un enlèvement important d'huile ou de matériau(x) devant être enlevé(s) sans détériorer les couches devant être retenues, pour récupérer, réusiner, recycler et/ou réutiliser la structure. Les procédés comprennent la surveillance et la modification des compositions.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO2008157345A2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO2008157345A2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO2008157345A23</originalsourceid><addsrcrecordid>eNrjZNAKd3RzDVIIcnX2cfR1DPH091Nw9vcN8A_2BLGDFRz9XBR8XUM8_F2CeRhY0xJzilN5oTQ3g7Kba4izh25qQX58anFBYnJqXmpJfLi_kYGBhaGpubGJqaORMXGqAPLGJbs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>WAFER RECLAMATION COMPOSITIONS AND METHODS</title><source>esp@cenet</source><creator>KORZENSKI, MICHAEL ; JIANG, PING ; HAN, JIANWEN ; LIU, JUN ; MINSEK, DAVID ; VISINTIN, PAMELA ; ZHOU, RENJIE ; HILGARTH, MONICA ; KING, MACKENZIE</creator><creatorcontrib>KORZENSKI, MICHAEL ; JIANG, PING ; HAN, JIANWEN ; LIU, JUN ; MINSEK, DAVID ; VISINTIN, PAMELA ; ZHOU, RENJIE ; HILGARTH, MONICA ; KING, MACKENZIE</creatorcontrib><description>Removal compositions and processes for removing at least one material layer from a rejected microelectronic device structure having same thereon. The removal composition preferably includes hydrofluoric acid. The composition achieves substantial removal of the material(s) to be removed while not damaging the layers to be retained, for reclaiming, reworking, recycling and/or reuse of said structure. Processes include the monitoring and modifying said compositions. L'invention concerne des compositions et procédés d'enlèvement destinés à enlever au moins une couche de matériau à partir d'une structure du dispositif micro-électronique rejetée ayant celle-ci dessus. La composition d'enlèvement comprend de préférence de l'acide fluorhydrique. La composition obtient un enlèvement important d'huile ou de matériau(x) devant être enlevé(s) sans détériorer les couches devant être retenues, pour récupérer, réusiner, recycler et/ou réutiliser la structure. Les procédés comprennent la surveillance et la modification des compositions.</description><language>eng ; fre</language><subject>ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES ; APPARATUS SPECIALLY ADAPTED THEREFOR ; CANDLES ; CHEMISTRY ; CINEMATOGRAPHY ; DETERGENT COMPOSITIONS ; DETERGENTS ; ELECTROGRAPHY ; FATTY ACIDS THEREFROM ; HOLOGRAPHY ; MATERIALS THEREFOR ; METALLURGY ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; RECOVERY OF GLYCEROL ; RESIN SOAPS ; SOAP OR SOAP-MAKING ; USE OF SINGLE SUBSTANCES AS DETERGENTS</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20081224&amp;DB=EPODOC&amp;CC=WO&amp;NR=2008157345A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20081224&amp;DB=EPODOC&amp;CC=WO&amp;NR=2008157345A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KORZENSKI, MICHAEL</creatorcontrib><creatorcontrib>JIANG, PING</creatorcontrib><creatorcontrib>HAN, JIANWEN</creatorcontrib><creatorcontrib>LIU, JUN</creatorcontrib><creatorcontrib>MINSEK, DAVID</creatorcontrib><creatorcontrib>VISINTIN, PAMELA</creatorcontrib><creatorcontrib>ZHOU, RENJIE</creatorcontrib><creatorcontrib>HILGARTH, MONICA</creatorcontrib><creatorcontrib>KING, MACKENZIE</creatorcontrib><title>WAFER RECLAMATION COMPOSITIONS AND METHODS</title><description>Removal compositions and processes for removing at least one material layer from a rejected microelectronic device structure having same thereon. The removal composition preferably includes hydrofluoric acid. The composition achieves substantial removal of the material(s) to be removed while not damaging the layers to be retained, for reclaiming, reworking, recycling and/or reuse of said structure. Processes include the monitoring and modifying said compositions. L'invention concerne des compositions et procédés d'enlèvement destinés à enlever au moins une couche de matériau à partir d'une structure du dispositif micro-électronique rejetée ayant celle-ci dessus. La composition d'enlèvement comprend de préférence de l'acide fluorhydrique. La composition obtient un enlèvement important d'huile ou de matériau(x) devant être enlevé(s) sans détériorer les couches devant être retenues, pour récupérer, réusiner, recycler et/ou réutiliser la structure. Les procédés comprennent la surveillance et la modification des compositions.</description><subject>ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES</subject><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CANDLES</subject><subject>CHEMISTRY</subject><subject>CINEMATOGRAPHY</subject><subject>DETERGENT COMPOSITIONS</subject><subject>DETERGENTS</subject><subject>ELECTROGRAPHY</subject><subject>FATTY ACIDS THEREFROM</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>METALLURGY</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>RECOVERY OF GLYCEROL</subject><subject>RESIN SOAPS</subject><subject>SOAP OR SOAP-MAKING</subject><subject>USE OF SINGLE SUBSTANCES AS DETERGENTS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAKd3RzDVIIcnX2cfR1DPH091Nw9vcN8A_2BLGDFRz9XBR8XUM8_F2CeRhY0xJzilN5oTQ3g7Kba4izh25qQX58anFBYnJqXmpJfLi_kYGBhaGpubGJqaORMXGqAPLGJbs</recordid><startdate>20081224</startdate><enddate>20081224</enddate><creator>KORZENSKI, MICHAEL</creator><creator>JIANG, PING</creator><creator>HAN, JIANWEN</creator><creator>LIU, JUN</creator><creator>MINSEK, DAVID</creator><creator>VISINTIN, PAMELA</creator><creator>ZHOU, RENJIE</creator><creator>HILGARTH, MONICA</creator><creator>KING, MACKENZIE</creator><scope>EVB</scope></search><sort><creationdate>20081224</creationdate><title>WAFER RECLAMATION COMPOSITIONS AND METHODS</title><author>KORZENSKI, MICHAEL ; JIANG, PING ; HAN, JIANWEN ; LIU, JUN ; MINSEK, DAVID ; VISINTIN, PAMELA ; ZHOU, RENJIE ; HILGARTH, MONICA ; KING, MACKENZIE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2008157345A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2008</creationdate><topic>ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES</topic><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CANDLES</topic><topic>CHEMISTRY</topic><topic>CINEMATOGRAPHY</topic><topic>DETERGENT COMPOSITIONS</topic><topic>DETERGENTS</topic><topic>ELECTROGRAPHY</topic><topic>FATTY ACIDS THEREFROM</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>METALLURGY</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>RECOVERY OF GLYCEROL</topic><topic>RESIN SOAPS</topic><topic>SOAP OR SOAP-MAKING</topic><topic>USE OF SINGLE SUBSTANCES AS DETERGENTS</topic><toplevel>online_resources</toplevel><creatorcontrib>KORZENSKI, MICHAEL</creatorcontrib><creatorcontrib>JIANG, PING</creatorcontrib><creatorcontrib>HAN, JIANWEN</creatorcontrib><creatorcontrib>LIU, JUN</creatorcontrib><creatorcontrib>MINSEK, DAVID</creatorcontrib><creatorcontrib>VISINTIN, PAMELA</creatorcontrib><creatorcontrib>ZHOU, RENJIE</creatorcontrib><creatorcontrib>HILGARTH, MONICA</creatorcontrib><creatorcontrib>KING, MACKENZIE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KORZENSKI, MICHAEL</au><au>JIANG, PING</au><au>HAN, JIANWEN</au><au>LIU, JUN</au><au>MINSEK, DAVID</au><au>VISINTIN, PAMELA</au><au>ZHOU, RENJIE</au><au>HILGARTH, MONICA</au><au>KING, MACKENZIE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>WAFER RECLAMATION COMPOSITIONS AND METHODS</title><date>2008-12-24</date><risdate>2008</risdate><abstract>Removal compositions and processes for removing at least one material layer from a rejected microelectronic device structure having same thereon. The removal composition preferably includes hydrofluoric acid. The composition achieves substantial removal of the material(s) to be removed while not damaging the layers to be retained, for reclaiming, reworking, recycling and/or reuse of said structure. Processes include the monitoring and modifying said compositions. L'invention concerne des compositions et procédés d'enlèvement destinés à enlever au moins une couche de matériau à partir d'une structure du dispositif micro-électronique rejetée ayant celle-ci dessus. La composition d'enlèvement comprend de préférence de l'acide fluorhydrique. La composition obtient un enlèvement important d'huile ou de matériau(x) devant être enlevé(s) sans détériorer les couches devant être retenues, pour récupérer, réusiner, recycler et/ou réutiliser la structure. Les procédés comprennent la surveillance et la modification des compositions.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre
recordid cdi_epo_espacenet_WO2008157345A2
source esp@cenet
subjects ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES
APPARATUS SPECIALLY ADAPTED THEREFOR
CANDLES
CHEMISTRY
CINEMATOGRAPHY
DETERGENT COMPOSITIONS
DETERGENTS
ELECTROGRAPHY
FATTY ACIDS THEREFROM
HOLOGRAPHY
MATERIALS THEREFOR
METALLURGY
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
RECOVERY OF GLYCEROL
RESIN SOAPS
SOAP OR SOAP-MAKING
USE OF SINGLE SUBSTANCES AS DETERGENTS
title WAFER RECLAMATION COMPOSITIONS AND METHODS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T17%3A56%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KORZENSKI,%20MICHAEL&rft.date=2008-12-24&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EWO2008157345A2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true