TEST APPARATUS, A SYSTEM AND A METHOD FOR THE BROAD-BAND EVALUATION OF THE RELATIVE DIELECTRIC CONSTANT OF LAMINATED MATERIALS FOR MICROWAVES

A system and a method for evaluating the relative dielectric constant of a laminated dielectric material are described, wherein: a waveguide device (26) is arranged to hold at least one slab (12) of dielectric material under test in a longitudinal arrangement, and a vector network analyzer (A) is co...

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Bibliographische Detailangaben

Hauptverfasser:	CARBONINI, LORENZO, VOLPI, LUIGI, GALLINA, ENRICO, PAGANA, ENRICO
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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