ETCH METHOD IN THE MANUFACTURE OF AN INTEGRATED CIRCUIT

The present invention provides a method for etching a substrate in the manufacture of a semiconductor device, the method comprising contacting a surface of the substrate with ions extracted from a plasma formed from a gas comprising one or more of an oxygen-containing species, a nitrogen-containing...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SPARKS, TERRY, G, RAUF, SHAHID
Format: Patent
Sprache:eng ; fre
Schlagworte:
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