CALIBRATION STRUCTURES FOR DIFFERENTIAL SIGNAL PROBING
A plurality of calibration structures facilitate calibration of a probing system that includes a differential signal probe having a linear array of probe tips. La présente invention concerne un dispositif comprenant une pluralité de structures d'étalonnage pour faciliter l'étalonnage d...
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| creator | CAMPBELL, RICHARD STRID, ERIC |
| description | A plurality of calibration structures facilitate calibration of a probing system that includes a differential signal probe having a linear array of probe tips.
La présente invention concerne un dispositif comprenant une pluralité de structures d'étalonnage pour faciliter l'étalonnage d'un système de sonde comportant un capteur de signal différentiel à réseau linéaire de points de test. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO2007145730A3</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO2007145730A3</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO2007145730A33</originalsourceid><addsrcrecordid>eNrjZDBzdvTxdApyDPH091MIDgkKdQ4JDXINVnDzD1Jw8XRzcw1y9QvxdPRRCPZ09wNSAUH-Tp5-7jwMrGmJOcWpvFCam0HZzTXE2UM3tSA_PrW4IDE5NS-1JD7c38jAwNzQxNTc2MDR2Jg4VQDWuSka</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CALIBRATION STRUCTURES FOR DIFFERENTIAL SIGNAL PROBING</title><source>esp@cenet</source><creator>CAMPBELL, RICHARD ; STRID, ERIC</creator><creatorcontrib>CAMPBELL, RICHARD ; STRID, ERIC</creatorcontrib><description>A plurality of calibration structures facilitate calibration of a probing system that includes a differential signal probe having a linear array of probe tips.
La présente invention concerne un dispositif comprenant une pluralité de structures d'étalonnage pour faciliter l'étalonnage d'un système de sonde comportant un capteur de signal différentiel à réseau linéaire de points de test.</description><language>eng ; fre</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080424&DB=EPODOC&CC=WO&NR=2007145730A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080424&DB=EPODOC&CC=WO&NR=2007145730A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CAMPBELL, RICHARD</creatorcontrib><creatorcontrib>STRID, ERIC</creatorcontrib><title>CALIBRATION STRUCTURES FOR DIFFERENTIAL SIGNAL PROBING</title><description>A plurality of calibration structures facilitate calibration of a probing system that includes a differential signal probe having a linear array of probe tips.
La présente invention concerne un dispositif comprenant une pluralité de structures d'étalonnage pour faciliter l'étalonnage d'un système de sonde comportant un capteur de signal différentiel à réseau linéaire de points de test.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBzdvTxdApyDPH091MIDgkKdQ4JDXINVnDzD1Jw8XRzcw1y9QvxdPRRCPZ09wNSAUH-Tp5-7jwMrGmJOcWpvFCam0HZzTXE2UM3tSA_PrW4IDE5NS-1JD7c38jAwNzQxNTc2MDR2Jg4VQDWuSka</recordid><startdate>20080424</startdate><enddate>20080424</enddate><creator>CAMPBELL, RICHARD</creator><creator>STRID, ERIC</creator><scope>EVB</scope></search><sort><creationdate>20080424</creationdate><title>CALIBRATION STRUCTURES FOR DIFFERENTIAL SIGNAL PROBING</title><author>CAMPBELL, RICHARD ; STRID, ERIC</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2007145730A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2008</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CAMPBELL, RICHARD</creatorcontrib><creatorcontrib>STRID, ERIC</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CAMPBELL, RICHARD</au><au>STRID, ERIC</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CALIBRATION STRUCTURES FOR DIFFERENTIAL SIGNAL PROBING</title><date>2008-04-24</date><risdate>2008</risdate><abstract>A plurality of calibration structures facilitate calibration of a probing system that includes a differential signal probe having a linear array of probe tips.
La présente invention concerne un dispositif comprenant une pluralité de structures d'étalonnage pour faciliter l'étalonnage d'un système de sonde comportant un capteur de signal différentiel à réseau linéaire de points de test.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | CALIBRATION STRUCTURES FOR DIFFERENTIAL SIGNAL PROBING |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T05%3A10%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CAMPBELL,%20RICHARD&rft.date=2008-04-24&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EWO2007145730A3%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |