MEMORY ARRAY WITH READOUT ISOLATION

Methods and apparatus for measuring the bit state of a particular element in an array of passive nonlinear elements that are insensitive to loading effects from external connections to the array, using, e.g., a switching element. Methods and apparatus for differentially measuring the bit state of a...

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Bibliographische Detailangaben

1. Verfasser:	NESTLER, ERIC
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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